SUBENT        C0193002   19981102                                 
BIB                  4          9                                 
REACTION   (8-O-16(D,P)8-O-17,PAR,DA)                             
SAMPLE     Ta2O5 sample and silicon wafer implanted with bismuth. 
MONITOR    (83-BI-209(A,EL)83-BI-209,,DA)                         
           From ratio of 16O(d,p)/209Bi(a,el) = 760+-15.          
ERR-ANALYS (DATA-ERR) Uncertainty given includes uncertainty in:  
           . absolute values of Bi standard,                      
           . thickness correction to (d,p) cross section,         
           . counting statistics in yield ratio measurements,     
           . geometry reporducibility in comparing to standard.   
ENDBIB               9          0                                 
COMMON               1          3                                 
EN         
MEV        
970.       
ENDCOMMON            3          0                                 
DATA                 5          1                                 
E-LVL      DATA       DATA-ERR   EN-NRM     MONIT      
MEV        MB/SR      MB/SR      MEV        MB/SR      
  0.87      13.3        0.4        2.0        1.007 +04
ENDDATA              3          0                                 
ENDSUBENT           21          0